NCCAVS 2017
See use at NCCAVS 38th Annual Equipment Exhibition Booth 41, February 23, 2017 Holiday Inn San Jose Airport, San Jose, California
SPIE Photonics West 2017
Please visit us at SPIE Photonics West 2017 booth number 2821 January 31 to February 2 The Moscone Center San Francisco, California, United States
OMS Witness Glass Changer
“New” Telemark Optical Monitor Witness Glass Changer 50 Monitor Spots That Can Be Used In Any Orientation 50 Optical Monitoring Positions Automatic Position Indexing Back side or Front side Monitoring Reflection or Transmission Measurements Port for Quartz Crystal Rate Sensor 4.5” Flange Mounting
Model 861 Deposition Controller
Telemark Press Release 9-3-2015 Telemark Announces the Model 861 Deposition Controller Telemark is announcing a new deposition controller that is a direct replacement for existing Maxtek 360 and Telemark 860 deposition controllers. The Process Recipes, I/O Settings and Physical Connections are all compatible with existing Maxtek 360/Telemark 860 units. Telemark data exchange software will...
Electron Beam Secondary Electron Management
Unfortunately there is no guarantee for eliminated “secondary electron“ penetration of substrate. This is caused by simple physics. However Telemark has developed ways to significantly reduce electron damage by design of the Telemark electron beam source. Click here for pdf - telemark_secondary_electron_app_note_6-26-15.pdf
Broadband vs Single Wavelength Monitoring
The historical method of calling an end of a layer in optical coating was to monitor a wavelength and when a condition was met calling the end of the layer. In the earliest days this method was done using the human eye of a trained observer. In some cases this...
Spectral Match Cut Points
The historical method of calling an end of a layer in optical coating was to monitor a wavelength and when a condition was met calling the end of the layer. As discussed in a previous application note the NVision optical monitor supports this method with good success. There is one problem...
Detecting Cut Points on Challenging Applications
One of principal issues of optical monitoring and control is the ability to handle cut points on difficult or noisy applications. Making measurements when things are easy is by definition easy! It gets more difficult when the nature of the actual measurement becomes less stable caused by the actual process...
Affordable Broadband Optical Monitoring Tools
Telemark announces the NVision line of optical measurement tools for thin film coating monitoring and control. With over 25 years of history, these tools allow automatic control of optical properties during the deposition process. Real time, broadband optical monitoring and control systems measuring a single measurement point or up to...
Low Stress, Densified Fluorides for IR Applications
Recent application work with infrared fluorides has demonstrated a significant advantage for IR applications. Using patented pulsing technology, the Telemark/Saintech ion sources have produced fully densified, index stable and stress control of fluoride compounds. These film properties can be achieved by deposition to unheated substrates. The study was performed in...