Telemark is the original inventor of the “lift top” cover electron beam source. The Telemark self-sealing cover is advantageous in thin film applications where material purity and cross contamination are a concern. Telemark’s unique all mechanical design provides reliable sealing performance without requiring in-vacuum motors or pneumatics.
Ebeam cover “lifts” as the hearth is ... Continue Reading →
Josh joins Telemark to enhance their process engineering and technical product development groups. Dr. Gurian earned his PhD in Physics from the University of Virginia, specializing in light-matter interaction. Josh’s scientific knowledge and experience in thin film processes and ion source technology brings a valuable level ... Continue Reading →
Telemark will be at booth 801
SVC TechCon 2017
Rhode Island Convention Center
Providence, Rhode Island, USA
May 2-3, 2017 Continue Reading →
See use at NCCAVS 38th Annual Equipment Exhibition Continue Reading →
Booth 41, February 23, 2017
Holiday Inn San Jose Airport, San Jose, California
Please visit us at SPIE Photonics West 2017 booth number 2821 Continue Reading →
January 31 to February 2
The Moscone Center
San Francisco, California, United States
“New” Telemark Optical Monitor Witness Glass Changer 50 Monitor Spots That Can Be Used In Any Orientation
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- 50 Optical Monitoring Positions
- Automatic Position Indexing
- Back side or Front side Monitoring
- Reflection or Transmission Measurements
- Port for Quartz Crystal Rate Sensor
- 4.5” Flange Mounting
Telemark Press Release 9-3-2015
Telemark Announces the Model 861 Deposition Controller
Telemark is announcing a new deposition controller that is a direct replacement for existing Maxtek 360 and Telemark 860 deposition controllers.
The Process Recipes, I/O Settings and Physical Connections are all compatible with existing Maxtek 360/Telemark 860 units.
Telemark data exchange software will allow users to transfer ... Continue Reading →
Unfortunately there is no guarantee for eliminated “secondary electron“ penetration of substrate. This is caused by simple physics. However Telemark has developed ways to significantly reduce electron damage by design of the Telemark electron beam source.
Click here for pdf – telemark_secondary_electron_app_note_6-26-15.pdf Continue Reading →
The historical method of calling an end of a layer in optical coating was to monitor a wavelength and when a condition was met calling the end of the layer. In the earliest days this method was done using the human eye of a trained observer. In some cases this is still done today but with the most limited of success. The next advent in coating control came with the advent of the ability to measure automatically the intensity of ... Continue Reading →
The historical method of calling an end of a layer in optical coating was to monitor a wavelength and when a condition was met calling the end of the layer. As discussed in a previous application note the NVision optical monitor supports this method with good success. There is one problem with this technology; the measurement of only one wavelength limits the potential precision as we are typically waiting until a condition has been exceeded such as a quarter wave minima or ... Continue Reading →