Please visit us at SPIE Photonics West 2017 booth number 2821
January 31 to February 2
The Moscone Center
San Francisco, California, United States
“New” Telemark Optical Monitor Witness Glass Changer 50 Monitor Spots That Can Be Used In Any Orientation
Telemark Press Release 9-3-2015
Telemark Announces the Model 861 Deposition Controller
Telemark is announcing a new deposition controller that is a direct replacement for existing Maxtek 360 and Telemark 860 deposition controllers.
The Process Recipes, I/O Settings and Physical Connections are all compatible with existing Maxtek 360/Telemark 860 units.
Telemark data exchange software will allow users to ...Continue Reading →
Unfortunately there is no guarantee for eliminated “secondary electron“ penetration of substrate. This is caused by simple physics. However Telemark has developed ways to significantly reduce electron damage by design of the Telemark electron beam source.Continue Reading →
The historical method of calling an end of a layer in optical coating was to monitor a wavelength and when a condition was met calling the end of the layer. In the earliest days this method was done using the human eye of a trained observer. In some cases this is still done today but with the most limited of success. The next advent in coating control came with the advent of the ability to measure automatically the intensity of ...Continue Reading →
The historical method of calling an end of a layer in optical coating was to monitor a wavelength and when a condition was met calling the end of the layer. As discussed in a previous application note the NVision optical monitor supports this method with good success. There is one problem with this technology; the measurement of only one wavelength limits the potential precision as we are typically waiting until a condition has been exceeded such as a quarter wave minima or ...Continue Reading →
One of principal issues of optical monitoring and control is the ability to handle cut points on difficult or noisy applications. Making measurements when things are easy is by definition easy! It gets more difficult when the nature of the actual measurement becomes less stable caused by the actual process parameters. The following display has been created by an offline tool used at Telemark for testing the cut point algorithm offline. Notice that the blue trace has some noise but ...Continue Reading →
Telemark announces the NVision line of optical measurement tools for thin film coating monitoring and control. With over 25 years of history, these tools allow automatic control of optical properties during the deposition process. Real time, broadband optical monitoring and control systems measuring a single measurement point or up to one hundred monitoring locations provide evaluation and control of thin films during growth. This data is highly accurate and laboratory quality.
Each lab quality measurement location operates in real time ...
Recent application work with infrared fluorides has demonstrated a significant advantage for IR applications. Using patented pulsing technology, the Telemark/Saintech ion sources have produced fully densified, index stable and stress control of fluoride compounds. These film properties can be achieved by deposition to unheated substrates. The study was performed in the Telemark applications lab and results were presented recently at the OIC conference in Whistler, Canada. Removal of inherent water peaks, index stabilization and fluoride dissociation has been a challenge ...Continue Reading →
Drawing on our leadership in the field of vacuum PVD coating, Telemark has released a new line of “value engineered” water vapor Cryotraps for PVD applications. To complement our existing line of TVP cryorefrigeration units, these “value engineered” systems support the necessity of water abatement in thin film PVD growth, while offering the lowest price per watt on the market. These systems eliminate the costly use of Ln2 and provide a fast payback for users.
Models include dual or single ...